Within the precise workshops of fabs and advanced packaging and testing bases, the flow of every silicon wafer, the parameters of every photolithography exposure, and the subtle variations in each etching process constantly transmit the "voice of the process." GETECH SPC (Statistical Process Control) acts as a data-driven ear, accurately capturing these hidden signals and transforming them into actionable insights through statistical analysis. It has delivered quantifiable value-including yield improvement, cost reduction, and enhanced customer trust-to over 50 semiconductor enterprises.

PDCA Full-Process Closed Loop: The Quality Control Logic from Data to Decision

Statistical Process Control (SPC) is a quality methodology that uses statistical techniques to monitor and manage production processes. Its core principle involves shifting from a passive "detect-after-the-fact" approach to a proactive "prevent-during-the-process" control method. By monitoring quality characteristic data in real-time during production, it distinguishes between normal process variation and abnormal variation, issuing early warnings before defects occur, thereby preventing problems proactively.

Semiconductor manufacturing, characterized by ultra-precision, high complexity, and multi-process coordination, demands exceptional quality control. GETECH SPC is specifically designed for these industry characteristics, establishing a complete PDCA cycle of "Data Collection → Monitoring & Analysis → Alert Linkage → Anomaly Handling → Continuous Improvement":

- Downward integration with machine sensors, measurement equipment, and facility systems for comprehensive real-time quality data access.

- Upward integration with MES (Manufacturing Execution System), EAP (Equipment Automation Program), and QMS (Quality Management System), creating a closed-loop system for anomaly resolution.

- Transforming every process parameter into traceable, analyzable, and optimizable quality evidence.

Six Core Advantages: Building Semiconductor-Grade Quality Control Barriers

GETECH's deep expertise in SPC delivers six distinct competitive advantages:

01 Comprehensive Data Access, Full-Chain Quality Coverage

Supports deep integration with systems including MES, EAP, WMS, and facility management. Utilizes multiple methods such as automated interface collection, file parsing (txt/excel/csv), and custom data entry to achieve end-to-end data coverage across IQC (Incoming Quality Control), IPQC (In-Process Quality Control), OQC (Outgoing Quality Control), and STC (Shipment Quality Control). Eliminates data silos to ensure accurate capture of all critical quality parameters.

02 User-Friendly System Configuration, Adapts to Dynamic Production Needs

Enables batch configuration of specifications and control rules. Features intelligent algorithms for automatic control limit updates that dynamically adapt to production line capability changes. Tight MES integration triggers automatic machine/lot Hold mechanisms upon anomaly detection to prevent defect spread. Supports modular configuration to flexibly accommodate different factories' specific control requirements.

03 Complete Control Metrics, Multi-Dimensional Analysis Supports Decisions

Supports various variable and attribute control charts including Xbar/S/R/X/MR/P/NP/C/U. Calculates process capability indices (CA/Cpk/Ppk/CpmK/Abnormal Ratio) in real-time. Provides visual statistical analysis tools including box plots, sample comparison charts, and trend charts. Incorporates 8 standard WECO rules for special cause detection (with customizable coefficients) for comprehensive process variation analysis, giving engineers multi-dimensional insight.

04 Real-Time Monitoring & Alerts, Instant Anomaly Response

Features an EKG-like real-time monitoring dashboard for intuitive process visualization. Three-tier intelligent alert system for OOS (Out of Specification), OOC (Out of Control), and OOW (Out of Warning) conditions delivers notifications via multiple channels (email, Enterprise WeChat, Feishu, etc.) with configurable frequency, ensuring immediate alert delivery to responsible personnel.

05 Efficient Graphical Operations, 80% Faster Data Analysis

Supports seamless switching between Chart and Report modes. Offers one-click chart merging, splitting, batch viewing, and correlated parameter comparison. Automatically overlays historical specification and control lines. Instant data point filtering and display significantly reduces engineering analysis time.

06 Worry-Free Architecture & Delivery, Security and Scalability Assured

Implements button-level permission controls and factory/line/department data isolation for security. B/S architecture enables direct browser access with unlimited users. Features are flexibly expandable with seamless upgrade capability. Backed by 50+ implementation projects and a dedicated 15+ member delivery team, providing localized support with rapid response.

50+ Case Studies: Semiconductor Quality Improvement Across All Scenarios

Leveraging extensive semiconductor industry expertise and a professional delivery team, GETECH SPC has been successfully implemented in 50+ projects across IDM, power devices, Micro LED, IGBT, and advanced packaging and testing segments. Covering front-end, back-end, packaging/test, and materials operations, it has earned recognition from leading clients with demonstrated results:

IDM manufacturer in Zhuzhou

Achieved 1%-5% yield increase and 10%-40% reduction in wafer scrap rate after replacing legacy SPC system, thanks to advanced data models and batch processing capabilities.

Front-end fab in Shenzhen

Implemented Online/Offline data monitoring with MES-integrated anomaly Hold mechanism, enabling fully digital OCAP (Out of Control Action Plan) processing and information synchronization, improving anomaly response speed by 50-90%.

Packaging and test provider in Yangzhou

Utilizing customized CPK trend reporting and control chart simulation functions, accurately calculated CPK compliance rates and optimized control limits, improving report generation efficiency by 30-60% while meeting diverse customer audit requirements.

Data shows that GETECH SPC customers achieve average improvements of: 10% product yield increase, 80% higher work efficiency, and 100% timely anomaly response rate.

Beyond SPC: The Quality Blueprint for Full-Stack Domestic CIM

Within GETECH's intelligent manufacturing ecosystem, SPC functions not as an isolated module but as a core component integrated with MES, EAP, FDC, and QMS systems to form a comprehensive domestic CIM (Computer Integrated Manufacturing) software suite. It enables data-driven integration across the Equipment-Process-Quality-Operations chain, helping semiconductor manufacturers transition from experience-based to data-driven decision making. This strengthens quality foundations in competitive markets and advances toward zero-defect manufacturing.

Choose GETECH SPC. Ensure every process step's "voice" is heard. Transform all data points into quality improvement drivers. Make quality control more precise, efficient, and intelligent!