SPC - SPC Statistical Process Control - SPC Quality Management - SPC Software - SPC System - Gechuang Dongzhi - Copy

Statistical Process Control (SPC)

Build an automatic detection + automatic monitoring + automatic feedback + automatic control closed-loop quality control system, safeguard quality stability, and create a digital and intelligent semiconductor manufacturing factory.

Diverse Data Access | Real-time Monitoring | Alert Linkage | Efficient Calculation | Rich Reports | Flexible Design | Improvement Optimization

Pain Points

1. Poor Customization Service

The original system design is rigid, with single analysis and functions, unable to support customization and secondary development.

2. Single Data Presentation Form

The factory needs to add more advanced data models, diversified reporting functions, and deep interaction between systems.

3. Scattered Quality Data

Small data monitoring scope, unable to fully cover quality data sources, difficult to meet more detailed and complex quality management needs.

4. Low Offline Management Efficiency

Offline software analysis, low efficiency, prone to errors, data authenticity not guaranteed, offline monitoring inflexible, unable to alert in time, low intelligence.

Core Advantages

  • Full-process Function Coverage, Empowering SPC Management
    Break down barriers between software, achieve data integration, build a quality closed-loop control system including data collection + monitoring analysis + alerting & linkage + exception handling + continuous improvement.
  • Diverse Data Access, Arbitrary Category Modeling
    Have diverse system interfaces, support diverse data collection, fully cover quality data sources. Build models such as Online/Offline/raw materials based on customer needs, perfectly matching customer business scenarios.
  • Multiple Optional Control Limits, Rich Management Indicators
    Control limits optional: ABL/Spec/Control limit/Warning limit. Rich control chart types: Raw, Mean, Range, StdDev, MR, n, np, c, u chart. Indicator calculation: AVG, STD, OCAP%, Ca, Cpk, Ppk, etc. Management rules: 8 standard WECO rules and Nelson rules, rule coefficients customizable.
  • Real-time Monitoring & Alerting, Timed Task Output
    Alerts sent in real-time, exceptions automatically held, linkage MES to trigger OCAP process. Save common query templates, set timed task data query results.

Application Scenarios

Display Panel

Array/CF/Cell module parameter control, OCAP processing, capability statistics.

Packaging Test

Key performance indicator Cpk statistics and control for processes such as die bonding, wire bonding, molding, cutting, etc.

Photovoltaic Wafer Slicing

Product/process/equipment/raw material data monitoring and capability analysis.

Semiconductor Chip

Quality data stability analysis and monitoring for key processes such as exposure, thin film, diffusion, etching, etc.

Cases

Case: SPC System - Semiconductor Manufacturing Intelligence Upgrade

Client: Semiconductor Chip

Effect: A semiconductor chip enterprise has diverse quality data sources, but the existing system cannot fully cover them; the factory needs to add more advanced data models, large quantities of control charts and reporting functions, and deeper interaction between software systems, unable to support customization and secondary development. GETECH SPC system collects diverse data such as Inline/Offline/WAT/CP, achieves data integration, builds models based on business scenarios, enables multiple monitoring perspectives, and uses statistical methods to construct a closed-loop quality control system including data collection + monitoring analysis + alerting & linkage + exception handling + continuous improvement, upgrading semiconductor manufacturing intelligence and enhancing fine quality management for leading semiconductor enterprises. After system launch, it achieves timely capture of product quality exceptions, enhances exception monitoring capability, reduces defect costs, improves product yield, and provides rich control charts and reporting functions, helping customers with data analysis, process capability improvement, and key quality benefits from continuous improvement.

Case: SPC System - Building Advanced Semiconductor Packaging Test Quality Control System

Client: Semiconductor Packaging Test

Effect: A semiconductor packaging and testing enterprise is unable to cover the entire process of data monitoring and data filtering, resulting in severe system lag, poor user experience on the operation interface, single control chart presentation format, inability to provide diversified data presentation, and lack of support for customized secondary development.
GETECH SPC system is integrated with the ME5 system to automatically upload data, analyze EXCEL data files at regular intervals, achieve online/offline comprehensive quality data monitoring, and hold products/machines in real time. Customized CPK trend report and control chart simulation function, efficiently and conveniently completing CPK compliance rate statistics and control limit calculation. The control chart report function is rich and diverse, meeting the diversified business needs of customers. Through the analysis and control of the entire factory production process, it provides customers with a reliable and refined quality management platform.
After the system goes online, it can comprehensively cover quality data, automatically/manually collect product data, timely capture quality anomalies, and improve data processing efficiency with industry standard rules and professional formulas. It can shorten analysis time by 80%, improve yield by 10%, and increase single factory economic benefits by 3 million RMB per year for factories.

Functional Modules

System homepage provides diverse user interaction functions such as template query (public/personal), timed query status, query records, system manual, system announcements, etc.; convenient for users to provide personalized settings;

Contact Us Online

Follow Us

Homepage Phone Contact us online
联系方式 +

*您关注的问题?

*您的联系方式?

*怎么称呼您?

*您的公司名字?